Submitted
to international journals:
Published:
60. C.
Pennetta, L. Reggiani, A. Carbone,
Transport and Excess Noise in
Polyacenes Under Trap Filling Transition, Journal of Physics: Conf. Series, 193, 012093, 2009.
54.
E. Alfinito, C. Pennetta, L. Reggiani,
"Topological Change
and Impedance Responses in Proteins: How Do They Run Together?", Journal of Applied
Physics, 105,
084703, 2009.
49.
C. Pennetta, E. Alfinito and L. Reggiani,
"1/f Noise and
Long-term Correlations in Multi-Species Resistor Networks", Procs. 19-th INT. Conf. on Noise and
Fluctuations (ICNF ), Tokyo, 9-14 September 2007, Eds. M.
Tacano, Y. Yamamoto and
M. Nakao, AIP Conf. Procs. Series, 922, 431, 2007.
46. G. Gomila, I. Casuso, A. Errachid, O. Ruiz, E. Pajot, J. Minic, T. Gorojankina, M. A. Persuy, J. Aioun, R. Salesse, J. Bausells, G. Villanueva, G. Rius, Y. Hou, N. Jaffrezic, C. Pennetta, E. Alfinito, V. Akimov, L. Reggiani, G. Ferrari, L. Fumagalli, M. Sampietro, J. Samitier, "Advances in the Production, Immobilization and Electrical Characterization of Olfactory Receptors for Olfactory Nanobiosensor Development", Sensors and Actuators B: Chemical, 116, 66, 2006.
45. Y. Hou,
S.
Helali, A. Zhang 2, N. Jaffrezic-Renault, C. Martelet, J. Minic, T.
Gorojankina, M. Persuy, E. Pajot-Augy, R. Salesse, F. Bessueille, J.
Samitier, A. Errachid, V. Akimov, L. Reggiani, C. Pennetta, E.
Alfinito, "Immobilization of Rhodopsin on a Self-Assembled
Multilayer and its
Specific Detection by Electrochemical Impedance Spectroscopy", Biosensors and Bioelectronics, 21, 1393 (2006).
44. C. Pennetta, V. Akimov, E. Alfinito, L. Reggiani, T. Gorojankina, J. Minic, E. Pajot-Augy, M. A. Persuy, R. Salesse, I. Casuso, A. Errachid, G. Gomila, O. Ruiz, J. Samitier, Y. Hou, N. Jaffrezic, G. Ferrari, L. Fumagalli, M. Sampietro, "Towards the Realization on Nanobiosensors based on G Protein-Coupled Receptors", chapter in Nanotechnologies for the Life Sciences, (Wiley-VCH Book series), vol. 4: Nanodevices for the Life Sciences, p. 277-240, ed. by Challa S. S. R. Kumar, Wiley-VCH, Berlin, 2006.
43. L.
Reggiani, C. Pennetta, V. Akimov, E. Alfinito, M. Rosini (Editors),
Unsolved Problems of Noise and
Fluctuations, Procs. of UPoN 2005, 4th Int. Conf. on Unsolved
Problems of Noise and Fluctuations in Physiscs, Biology and High
Technology, AIP Conf. Procs., 800,
New York, 2005.
42. G. Gomila,
A. Errachid, F. Bessueille, O. Ruiz, I. Casuso, E. Pajot, J. Minic, T.
Gorojankina, R. Salesse, J.G. Villanueva, J. Bausells, C. Pennetta, E.
Alfinito, Della Sala F., V. Akimov, L. Reggiani, Y. Hou, N. Jaffrezic,
G. Ferrari, L. Fumagalli, M. Sampietro, J. Samitier,
"Development of an Artificial Nose Integrating NEMS and Biological
Olfactory Receptors", Procs. of the 2005 Spanish Conf. on Electron
Devices, Tarragona, Spain, Feb. 2-4, 2005, IEEE Procs., 05 EX 965, (2005).
41. C.
Pennetta, V. Akimov, E. Alfinito, L. Reggiani, G. Gomila, G. Ferrari,
L. Fumagalli, M. Sampietro,
"Modelization of Thermal Fluctuations in G Protein-Coupled Receptors",
in Noise and Fluctuations,
ed. by T. Gonzales, J. Mateos, D. Pardo, 611, AIP Conf. Procs., 780, New York, 2005.
40. C.
Pennetta, E. Alfinito, L. Reggiani and S. Ruffo,
"Non-Gaussian Fluctuations in Biased Resistor Networks: Size Effects
Versus Universal Behavior", in Noise
and Fluctuations, ed. by T. Gonzales, J. Mateos, D. Pardo,
125-130, AIP Conf. Procs., 780,
New York, 2005 (invited paper).
39. E.
Alfinito, V. Akimov, C. Pennetta, L. Reggiani and G. Gomila,
"Thermal Fluctuations of a GPCR: A Two Force Constant Model", in Unsolved Problems of Noise and Fluctuations,
ed. by L. Reggiani, C. Pennetta, V. Akimov, E. Alfinito, M. Rosini, AIP
Conf. Procs., 800, 381, New
York, 2005.
38. C.
Pennetta and E. Alfinito,
"Distribution of Return Periods of Rare Events in Correlated Time
Series", in Unsolved Problems of
Noise and Fluctuations, ed. by L. Reggiani, C. Pennetta, V.
Akimov, E. Alfinito, M. Rosini, AIP Conf. Procs., 800, 546, New York, 2005 (invited
paper).
36. C.
Pennetta, V. Akimov, E.
Alfinito,
L. Reggiani and G. Gomila,
"Fluctuations of Complex Networks: Electrical Properties of Single
Protein Nanodevices" (Invited paper), in Noise and Information in
Nanoelectronics, Sensors and Standard,
Ed. by J. M. Smulko, Y. Blanter, I. M. Dykman and L. B. Kish, SPIE
Proc., 5472, 172 (2004), q-bio.MN/0406018.
35. C.
Pennetta, E. Alfinito, L.
Reggiani
and S. Ruffo,
"Non-Gaussian Resistance Fluctuations in Disordered Materials", in
Noise in Complex Systems and Stochastic Dynamics, Ed. by Z.
Gingl, J. M. Sancho, L. Schimansky-Geier and J. Kertesz, SPIE
Proc.,
5471, 38 (2004), cond-mat/0408057.
34. G.
Gomila, C. Pennetta, L.
Reggiani,
M. Sampietro, G. Ferrari and G. Bertuccio,
"Shot Noise in Linear Macroscopic Resistors", Phys. Rev. Lett.,
92, 226601
(2004).
33. C.
Pennetta, E. Alfinito. L.
Reggiani
and S. Ruffo,
"Non-Gaussian Resistance Noise Near Electrical Breakdown of Granular
Materials",
Physica A, 340, 380 (2004).
32. C.
Pennetta, E. Alfinito and L.
Reggiani,
"Linear and nonlinear regime of Random Resistor Network under biased
percolation"
Computational Material Science, 30, 120 (2004).
31. C.
Pennetta, E. Alfinito, L.
Reggiani
and S. Ruffo,
"Non-Gaussianity of Resistance Fluctuations Near Electrical Breakdown",
Semicond. Science Technol. 19, S164 (2004).
30. E.
Alfinito, C. Pennetta,
L. Reggiani, F. Fantini, I. De Munari and A. Scorzoni,
"Simulation of Electromigration Phenomena and Associated
Resistance
Noise in Al-Cu Metallic Lines",
in Noise and Fluctuations, Proc. 17-th International
Conf.
on Noise and Fluctuations, Praga 18-23 August 2003, ed. by J.
Sikula, CNRL s.r.o., Brno, pp 759-762 (2003).
29. C.
Pennetta, E. Alfinito, L.
Reggiani,
V. Akimov, M. Borgarino and F. Fantini,
"1/f Noise in the Steady State of Random Resistor Networks", in Noise
and Fluctuations,
Proc. 17-th International Conf. on Noise and Fluctuations, Praga
18-23 August 2003, ed. by
J. Sikula, CNRL s.r.o., Brno, pp 651-654 (2003).
28.
C. Pennetta, E. Alfinito
and
L. Reggiani,
"Steady State of Random Resistor Networks Under Biased Percolation: a
Framework
for Noise and Conduction in Disordered Materials?", Proc. of the
3th Int. Conf. on Unsolved Problems of
Noise and Fluctuations in Physics, Biology and High Technology, Washington
DC, September 2002, (invited paper), Ed. S. M. Bezrukov, AIP Conf.
Proc.
665,
480-487(2003).
26.
L. B. Kish, C.
Pennetta
and Z. Gingl,
"Biased Percolation Approach to Failure Propagation in Nanostructures
and prediction of the Total Failure
by Electronic Noise Analysis", in Nanoscale Optics and
Applications,
ed. by G. Cao and W. P. Kirk, SPIE Proc. 4809,
217 (2002).
25.
C. Pennetta,
"Resistance Noise Near to Electrical Breakdown: Steady State of Random
Networks as a Function of the Bias",
Fluctuation and Noise Letters, 2, R29, 2002.
24.
C. Pennetta, L. Reggiani,
G. Trefan and E. Alfinito,
"Resistance and Resistance Fluctuations in Random Resistor Networks
Under Biased Percolation",
Physical Review E, 65, 066119, 2002.
23.
C. Pennetta, L. Reggiani,
G. Trefan,
"A Percolative Model of Soft Breakdown in Ultrathin Oxides", Physica
B, 314, 400, 2002.
22.
C. Pennetta, L. Reggiani,
E. Alfinito and G. Trefan,
"Stationary Regime of Random Resistor Networks Under Biased
Percolation",
Journal of Physics: Condensed Matter, 14, 2371, 2002.
21.
C. Pennetta,
"Scaling and Universality of Resistance Noise Near to Electrical
Breakdown",
in Noise in Physical Systems
and 1/f Fluctuations, ed. by G. Bosman, p. 685, World
Scientific,
Singapore, 2001, (invited paper).
20.
G. Trefan, C. Pennetta and
L. Reggiani,
"A Percolative Approach to Current Fluctuations in the Soft Breakdown
of Ultrathin Oxides",
in Noise in Physical Systems and 1/f Fluctuations, ed.
by G. Bosman, p. 735, World Scientific, Singapore, 2001.
19.
G. Gomila, L. Reggiani,C.
Pennetta,
M. Sanpietro, G. Ferrari and G. Bertuccio,
"Shot Noise in Macroscopic Resistors: a Predicted Experimental
Evidence?",
in Noise in Physical Systems and 1/f Fluctuations, ed. by
G. Bosman, p. 289, World Scientific, Singapore, 2001.
18.
C. Pennetta, L. Reggiani,
G. Trefan,
"A Percolative Approach to Degradation of Thin Films for Reliability
of Electronic Devices",
Proc. of the 25th International Conference on the Physics of
Semiconductors,
Settembre 2000, Osaka,
Springer Proc. in Phys. 87, p. 1763, Berlin, 2001.
17.
C. Pennetta, L. Reggiani,
G. Trefan, F. Fantini, A. Scorzoni and I. De Munari,
"Investigation of the Role of Compositional Effects on Electromigration
Damage of Metallic Interconnects",
Computational Material Science, 22, 13, 2001.
16.
C. Pennetta, L. Reggiani
and
G. Trefan,
"Scaling Relations and Universality in Electrical Failure Processes
of Thin Films: Is It Possible to Predict Failure Times?", Computational
Material Science, 22, 7, 2001.
15.
C. Pennetta, L. Reggiani,
G. Trefan, R. Cataldo, G. De Nunzio,
"A Percolative Approach to Reliability of thin Film Interconnects
and Ultra-Thin Dielectrics", VLSI Design, 13, 363,
2001.
14.
C. Pennetta, L. Reggiani,
G. Trefan, F. Fantini, A. Scorzoni and I. De Munari,
"A Percolative Approach to Electromigration of Metallic Lines",
Journal
of Physics D: Appl. Phys., 34, 1421, 2001.
13.
C. Pennetta, L. Reggiani
"Electrical Instability of Thin Films Driven by Joule Heating", Computational
Materials Science, 20, 451, 2001.
12. C.
Pennetta,
L. Reggiani, G. Trefan,
"A Monte Carlo Percolative Approach to Reliability Analysis of
Semiconductor
Structures",
Mathematics and Computers in Simulation, 55, 231, 2001.
11.
C. Pennetta, L. Reggiani, G. Trefan, F. Fantini, I. De Munari and
A. Scorzoni,
"A Percolative Simulation of Electromigration Phenomena", Microelectronic
Engineering, 55, 349, 2001.
10.
C. Pennetta, L. Reggiani,
G. Trefan, F. Fantini, I. De Munari and A. Scorzoni,
"A Percolative Approach of Electromigration Modelling", in Materials,
Technology
and Reliability for Advanced Interconnects and Low-k Dielectrics,
ed.
by K. Maex, Y. C. Joo, G. S. Oehrlein, S. Ogawa, J. T. Wetzel, Mat.
Res. Soc. Symp. Proc. 612, D2.7.1, 2000.
9. C.
Pennetta, L.
Reggiani
and G. Trefan,
"Scaling Law of Resistance Fluctuations in Stationary Random Resistor
Networks",
Physical Review Letters, 85, 5238, 2000.
8.
C. Pennetta, L. Reggiani and
G. Trefan,
"Scaling and Universality in Electrical Failure of Thin Films", Physical
Review Letters, 84, 5006, 2000.
7. C. Pennetta, L. Reggiani and
G. Trefan,
"A Percolative Approach to Reliability of Thin Films", IEEE Trans.
on Electronic Devices, 47, 1986, 2000.
6. L. Reggiani, C. Pennetta, G. Trefan, J.C. Vaissiere, L. Varani, V. Gruzinskis, A. Reklaitis, P. Shiktorov, E. Starikov, T. Gonzalez, J. Mateos, D. Pardo, O.M. Bulashenko, "Frontiers in Electronic Noise: from Submicron to Nano Structures", International Journal oh High Speed Electronics and Systems, 10, 111, 2000.
5. C.
Pennetta, G.
Trefan,
L. Reggiani,
"A Percolative Approach to Resistance Fluctuations", in Unsolved
Problems on Noise and Fluctuations , Ed. by D. Abbott and
L.B. Kish, p.447, American Istitute of
Physics,
2000.
4. C.
Pennetta, G.
Trefan,
L. Reggiani, F. Fantini, I. DeMunari, A. Scorzoni,
"'A Stochastic Approach to Failure Analysis in Electromigration
Phenomena",
Microelectronics
Reliability, 39, 857, 1999.
3. C.
Pennetta, L. B.
Kiss,
Z. Gingl and L. Reggiani,
"A Noise Temperature Analysis of the Electrical Degradation of Thin
Nanostructured Films", Journal of Nanoparticles Research,2,
97, 2000.
2. C.
Pennetta, L. B.
Kiss,
Z. Gingl and L. Reggiani,
"Excess Thermal-Noise in the Electrical Breakdown of Random Resistor
Networks", European Physical Journal B, 12, 61, 1999.
1. C. Pennetta, L. Reggiani
and
L. B. Kiss,
"Thermal Effects on the Electrical Degradation of Thin Film Resistors",
Physica
A, 266, 214, 1999.